TY - JOUR T1 - Modeling temperature dependent avalanche characteristics of InP JO - Journal of Lightwave Technology UR - http://eprints.whiterose.ac.uk/152395/ PY - 2019/10/17 AU - Petticrew J AU - Dimler S AU - Tan CH AU - Ng JS ED - DO - DOI: 10.1109/jlt.2019.2948072 PB - Institute of Electrical and Electronics Engineers (IEEE) Y2 - 2024/12/20 ER -