TY  - JOUR

T1  - Z-contrast Imaging Analysis of Semiconductor Epitaxies: Application to GaNAs Quantum Wells and InAs/GaInAs/GaAs Dot in Well Structures

JO  - Microscopy and Microanalysis

PY  - 2007/08/06

AU  - Herrera M

AU  - Ramasse QM

AU  - Browning ND

AU  - González D

AU  - Garcia R

AU  - Hopkinson M

ED  - 

DO  - DOI: 10.1017/s1431927607073588

PB  - Cambridge University Press (CUP)

VL  - 13

IS  - S02

Y2  - 2024/12/22

ER  -