@inproceedings{inproceedings, title  = {{Package-related degradation condition monitoring of SiC power MOSFETs using current distribution anomaly detection}},

 publisher = {{Institution of Engineering and Technology}},

 url = {{http://dx.doi.org/10.1049/icp.2022.1145 }},

 year = {{2022}},

 month = {{1}},

 author = {{Naghibi J and Mohsenzade S and Mehran K and Foster MP}},

 doi = {{10.1049/icp.2022.1145}},

 journal = {{11th International Conference on Power Electronics, Machines and Drives (PEMD 2022)}},

 note = {{Accessed on 2024/12/22}}}