TY  - CONF

T1  - The effect of thin crystal strain relaxation on high-resolution images of Si/Si0.8Ge0.2 quantum wells

JO  - ELECTRON MICROSCOPY 1994, VOL 1

PY  - 1994/01/01

AU  - WALTHER T

AU  - BOOTHROYD CB

AU  - HUMPHREYS CJ

AU  - CULLIS AG

ED  - Jouffrey B

ED  - Colliex C

SP  - 365

EP  - 366

Y2  - 2024/12/20

ER  -