TY  - JOUR

T1  - Origin of porosity in triol sol-gel PbZr <inf>53</inf>Ti <inf>47</inf>O <inf>3</inf> single layer thin films deposited on Pt/Ti/SiO <inf>2</inf>/Si substrates

JO  - Ferroelectrics

PY  - 2002/01/01

AU  - Zhou Z

AU  - Reaney IM

AU  - Hind D

AU  - Milne SJ

ED  - 

DO  - DOI: 10.1080/00150190211522

VL  - 271

SP  - 353

EP  - 358

Y2  - 2024/12/22

ER  -