TY  - CONF

T1  - An Online Failure Assessment Approach for SiC-based MOSFET Power Modules Using Iterative Condition Monitoring Technique

JO  - 2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL)

UR  - http://dx.doi.org/10.1109/compel49091.2020.9265830

PY  - 2020/11/09

AU  - Naghibi J

AU  - Mehran K

AU  - Foster MP

ED  - 

DO  - DOI: 10.1109/compel49091.2020.9265830

PB  - IEEE

Y2  - 2024/12/22

ER  -