@inproceedings{inproceedings, title  = {{ConceptEM: a new method to quantify solute segregation to interfaces or planar defect structures by analytical TEM and applications to inversion domain boundaries in doped zinc oxide}},

 url = {{}},

 year = {{2005}},

 month = {{1}},

 author = {{Walther T and Recnik A and Daneu N}},

 volume = {{107}},

 journal = {{Microscopy of Semiconducting Materials}},

 pages = {{199-202}},

 note = {{Accessed on 2024/12/20}}}