TY  - JOUR

T1  - Measurement and Characterization Technique for Real-Time Die Temperature Prediction of MOSFET-Based Power Electronics

JO  - IEEE Transactions on Power Electronics

UR  - http://eprints.whiterose.ac.uk/90214/

PY  - 2015/09/03

AU  - Davidson J

AU  - Stone D

AU  - Foster M

AU  - Gladwin D

ED  - 

DO  - DOI: 10.1109/TPEL.2015.2476557

VL  - 31

IS  - 6

SP  - 4378

EP  - 4388

Y2  - 2024/12/22

ER  -