TY  - CHAP

T1  - Characterization of InGaAs (N)/GaAsN multi-quantum wells using transmission electron microscopy

T2  - Microscopy of Semiconducting Materials 2003

UR  - http://dx.doi.org/10.1201/9781351074636-33

PY  - 2018/01/10

AU  - Gutiérrez M

AU  - Herrera M

AU  - Ross I

AU  - González D

AU  - Hopkinson M

AU  - García R

ED  - 

DO  - DOI: 10.1201/9781351074636-33

PB  - CRC Press

SP  - 143

EP  - 146

Y2  - 2024/12/22

ER  -