TY  - CHAP

T1  - Universal Relation Between Avalanche Breakdown Voltage and Bandstructure in Wide-Gap Semiconductors

T2  - Hot Carriers in Semiconductors

PY  - 1996/02/06

AU  - Allam J

AU  - David JPR

ED  - 

DO  - DOI: 10.1007/978-1-4613-0401-2_78

PB  - Springer US

SN  - 9781461380351

SP  - 343

EP  - 346

Y2  - 2024/12/20

ER  -