TY  - CONF

T1  - Metamorphic testing with causal graphs

JO  - 2023 IEEE Conference on Software Testing, Verification and Validation (ICST)

UR  - https://eprints.whiterose.ac.uk/id/eprint/195317

PY  - 2023/05/26

AU  - Clark AG

AU  - Foster M

AU  - Walkinshaw N

AU  - Hierons RM

ED  - 

DO  - DOI: 10.1109/ICST57152.2023.00023

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SN  - 9781665456678

Y2  - 2024/12/21

ER  -