TY  - JOUR

T1  - BlurRes-UNet: A novel neural network for automated surface characterisation in metrology

JO  - Computers in Industry

UR  - https://doi.org/10.1016/j.compind.2024.104228

PY  - 2025/02/01

AU  - Cui W

AU  - Lou S

AU  - Zeng W

AU  - Kadirkamanathan V

AU  - Qin Y

AU  - Scott PJ

AU  - Jiang X

ED  - 

DO  - DOI: 10.1016/j.compind.2024.104228

PB  - Elsevier BV

VL  - 165

SP  - 104228

EP  - 104228

Y2  - 2025/02/05

ER  -