@inproceedings{inproceedings, title  = {{Single Event Effects in Power MOSFETs and SRAMs Due to 3 MeV, 14 MeV and Fission Neutrons}},

 publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},

 url = {{http://dx.doi.org/10.1109/tns.2011.2106142 }},

 year = {{2011}},

 month = {{2}},

 author = {{Hands A and Morris P and Dyer C and Ryden K and Truscott P}},

 doi = {{10.1109/tns.2011.2106142}},

 volume = {{58}},

 journal = {{IEEE Transactions on Nuclear Science}},

 issue = {{3}},

 pages = {{952-959}},

 note = {{Accessed on 2024/12/20}}}