@inproceedings{inproceedings, title  = {{The Cause of Subthreshold Leakage Currents Induced by Nucleons and Ions in Power MOSFETs}},

 publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},

 url = {{http://dx.doi.org/10.1109/tns.2013.2246870 }},

 year = {{2013}},

 month = {{3}},

 author = {{Chugg AM and Parker S and Duncan and Barber TS and Hands A and Morris P and Poivey C}},

 doi = {{10.1109/tns.2013.2246870}},

 volume = {{60}},

 journal = {{IEEE Transactions on Nuclear Science}},

 issue = {{4}},

 pages = {{2530-2536}},

 note = {{Accessed on 2024/12/20}}}