TY  - CONF

T1  - Electron energy loss spectroscopic profiling of semiconductor hetero- and nano-structures: theory, implementation, applications

JO  - MICROSCOPY OF SEMICONDUCTING MATERIALS 2003

UR  - http://eprints.whiterose.ac.uk/137430/

PY  - 2003/01/01

AU  - Walther T

ED  - Cullis AG

ED  - Midgley PA

IS  - 180

SP  - 27

EP  - 32

Y2  - 2024/10/23

ER  -