TY  - JOUR

T1  - A comparative study of epitaxial InGaAsBi/InP structures using Rutherford backscattering spectrometry, X-ray diffraction and photoluminescence techniques

JO  - Journal of Applied Physics

UR  - http://eprints.whiterose.ac.uk/152938/

PY  - 2019/09/26

AU  - Sharpe MK

AU  - Marko IP

AU  - Duffy DA

AU  - England J

AU  - Schneider E

AU  - Kesaria M

AU  - Fedorov V

AU  - Clarke E

AU  - Tan CH

AU  - Sweeney SJ

ED  - 

DO  - DOI: 10.1063/1.5109653

PB  - AIP Publishing

VL  - 126

IS  - 12

Y2  - 2024/12/20

ER  -