TY  - CONF

T1  - Analysis of voltage source converters under DC line-to-line short-circuit fault conditions

JO  - 2017 IEEE 26th International Symposium on Industrial Electronics (ISIE)

UR  - http://eprints.whiterose.ac.uk/130499/

PY  - 2017/08/03

AU  - Alwash M

AU  - Sweet M

AU  - Narayanan EMS

ED  - 

DO  - DOI: 10.1109/isie.2017.8001522

PB  - IEEE

Y2  - 2024/12/20

ER  -