TY  - JOUR

T1  - Influence of mobility model on extraction of stress dependent source-drain series resistance

JO  - Microelectronics Reliability

PY  - 2004/01/01

AU  - De Souza MM

AU  - Manhas SK

AU  - Chandra Sekhar D

AU  - Oates AS

AU  - Chaparala P

ED  - 

DO  - DOI: 10.1016/j.microrel.2003.09.005

VL  - 44

IS  - 1

SP  - 25

EP  - 32

Y2  - 2024/12/20

ER  -