TY  - JOUR

T1  - Defect photoluminescence from pulsed‐laser‐annealed ion‐implanted Si

JO  - Applied Physics Letters

PY  - 1981/01/01

AU  - Skolnick MS

AU  - Cullis AG

AU  - Webber HC

ED  - 

DO  - DOI: 10.1063/1.92405

PB  - AIP Publishing

VL  - 38

IS  - 6

SP  - 464

EP  - 466

Y2  - 2024/12/22

ER  -