TY  - JOUR

T1  - PestNet : an end-to-end deep learning approach for large-scale multi-class pest detection and classification

JO  - IEEE Access

UR  - http://eprints.whiterose.ac.uk/150790/

PY  - 2019/04/10

AU  - Liu L

AU  - Wang R

AU  - Xie C

AU  - Yang P

AU  - Wang F

AU  - Sudirman S

AU  - Liu W

ED  - 

DO  - DOI: 10.1109/access.2019.2909522

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 7

SP  - 45301

EP  - 45312

Y2  - 2024/12/23

ER  -