@article{article, title  = {{Scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films}},

 publisher = {{The Optical Society}},

 url = {{http://eprints.whiterose.ac.uk/153548/ }},

 year = {{2019}},

 month = {{10}},

 author = {{Trager-Cowan C and Alasmari A and Avis W and Bruckbauer J and Edwards PR and Hourahine B and Kraeusel S and Kusch G and Johnston R and Naresh-Kumar G and Martin RW et al}},

 doi = {{10.1364/prj.7.000b73}},

 volume = {{7}},

 journal = {{Photonics Research}},

 issue = {{11}},

 pages = {{B73-B82}},

 note = {{Accessed on 2024/12/21}}}