TY  - CONF

T1  - Sensitivity of Lumped Parameter Battery Models to Constituent Parallel-RC Element Parameterisation Error

JO  - IECON 2014 - 40TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY

PY  - 2014/01/01

AU  - Nejad S

AU  - Gladwin DT

AU  - Stone DA

AU  - IEEE

ED  - 

SP  - 5660

EP  - 5665

Y2  - 2024/12/22

ER  -