TY  - JOUR

T1  - A methodology for extraction of the density of interface states in the presence of frequency dispersion via the conductance technique

JO  - IEEE Transactions on Electron Devices

PY  - 2010/07/01

AU  - Sicre SBF

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1109/TED.2010.2049208

VL  - 57

IS  - 7

SP  - 1642

EP  - 1650

Y2  - 2024/12/20

ER  -