TY  - CONF

T1  - Analysis of a clustered IGBT and silicon carbide MOSFET hybrid switch

JO  - 2017 IEEE 26th International Symposium on Industrial Electronics (ISIE)

UR  - http://eprints.whiterose.ac.uk/130498/

PY  - 2017/06/28

AU  - Luo P

AU  - Long HY

AU  - Sweet MR

AU  - De Souza MM

AU  - Narayanan EMS

ED  - 

DO  - DOI: 10.1109/isie.2017.8001316

PB  - IEEE

Y2  - 2024/12/20

ER  -