TY  - CONF

T1  - Temperature dependence of avalanche breakdown in GaAs p-i-n diodes

JO  - HITEN 99. Third European Conference on High Temperature Electronics. (IEEE Cat. No.99EX372)

PY  - 1999/01/01

AU  - David JPR

AU  - Ghin R

AU  - Plimmer SA

AU  - Rees GJ

AU  - Grey R

ED  - 

DO  - DOI: 10.1109/hiten.1999.827492

PB  - AEA Technol

Y2  - 2024/12/20

ER  -