TY  - JOUR

T1  - Testing from a nondeterministic finite state machine using adaptive state counting

JO  - IEEE Transactions on Computers

PY  - 2004/01/01

AU  - Hierons RM

ED  - 

DO  - DOI: 10.1109/tc.2004.85

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 53

IS  - 10

SP  - 1330

EP  - 1342

Y2  - 2024/12/21

ER  -