TY  - JOUR

T1  - Critical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction

JO  - Ultramicroscopy

PY  - 2005/10/01

AU  - Jungk T

AU  - Walther T

AU  - Mader W

ED  - 

DO  - DOI: 10.1016/j.ultramic.2005.04.003

VL  - 104

IS  - 3-4

SP  - 206

EP  - 219

Y2  - 2024/12/20

ER  -