@article{article, title  = {{The effect of gate bias stress and temperature on the performance of ZnO Thin Film Transistors}},

 url = {{}},

 year = {{2008}},

 month = {{1}},

 author = {{Cross RBM and De Souza MM}},

 volume = {{8}},

 journal = {{IEEE Trans. Device and Materials Reliability}},

 pages = {{277}},

 note = {{Accessed on 2024/12/20}}}