TY  - JOUR

T1  - Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces

JO  - Ultramicroscopy

PY  - 2003/01/01

AU  - Walther T

ED  - 

DO  - DOI: 10.1016/S0304-3991(03)00104-9

VL  - 96

IS  - 3-4

SP  - 401

EP  - 411

Y2  - 2024/12/20

ER  -