TY  - JOUR

T1  - Self-consistent method for quantifying indium content from X-ray spectra of thick compound semiconductor specimens in a transmission electron microscope

JO  - Journal of Microscopy

UR  - http://eprints.whiterose.ac.uk/91475/

PY  - 2016/05/01

AU  - Walther T

AU  - Wang X

ED  - 

DO  - DOI: 10.1111/jmi.12291

PB  - Wiley: 12 months

VL  - 262

IS  - 2

SP  - 151

EP  - 156

Y2  - 2024/12/20

ER  -