TY  - CONF

T1  - Nanoscale Imaging of CaCu<sub>3</sub>Ti<sub>4</sub>O<sub>12</sub> Dielectric Properties: The Role of Surface Defects

JO  - Solid State Phenomena

PY  - 2008/01/01

AU  - Raineri V

AU  - Fiorenza P

AU  - Lo Nigro R

AU  - Sinclair DC

ED  - 

DO  - DOI: 10.4028/www.scientific.net/ssp.131-133.443

PB  - Trans Tech Publications, Ltd.

VL  - 131-133

SP  - 443

EP  - 448

Y2  - 2024/12/22

ER  -