TY  - JOUR

T1  - Scanning transmission electron microscopy measurement of bismuth segregation in thin Ga(As,Bi) layers grown by molecular beam epitaxy

JO  - Crystal Research and Technology

UR  - http://eprints.whiterose.ac.uk/91479/

PY  - 2014/07/03

AU  - Walther T

AU  - Richards RD

AU  - Bastiman F

ED  - 

DO  - DOI: 10.1002/crat.201400157

PB  - Wiley

VL  - 50

IS  - 1

SP  - 38

EP  - 42

Y2  - 2024/12/20

ER  -