TY  - CONF

T1  - Large-Scale Multiple Cell Upsets in 90 nm Commercial SRAMs During Neutron Irradiation

JO  - IEEE Transactions on Nuclear Science

UR  - http://dx.doi.org/10.1109/tns.2012.2217383

PY  - 2012/10/18

AU  - Hands A

AU  - Morris P

AU  - Ryden K

AU  - Dyer C

ED  - 

DO  - DOI: 10.1109/tns.2012.2217383

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 59

IS  - 6

SP  - 2824

EP  - 2830

Y2  - 2024/12/22

ER  -