@inproceedings{inproceedings, title  = {{Degradation behaviour of polysilicon high voltage thin film transistors}},

 publisher = {{IEEE}},

 url = {{}},

 year = {{2002}},

 month = {{1}},

 author = {{Mugnier M and Manhas SK and Chandra Sekhar D and Krishnan S and Cross R and Sankara Narayanan EM and De Souza MM and Flores D and Vellvehi M and Millan J}},

 doi = {{10.1109/ipfa.2002.1025666}},

 journal = {{Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614)}},

 note = {{Accessed on 2024/12/20}}}