TY  - CONF

T1  - Degradation behaviour of polysilicon high voltage thin film transistors

JO  - Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614)

PY  - 2002/01/01

AU  - Mugnier M

AU  - Manhas SK

AU  - Chandra Sekhar D

AU  - Krishnan S

AU  - Cross R

AU  - Sankara Narayanan EM

AU  - De Souza MM

AU  - Flores D

AU  - Vellvehi M

AU  - Millan J

ED  - 

DO  - DOI: 10.1109/ipfa.2002.1025666

PB  - IEEE

Y2  - 2024/12/20

ER  -