TY  - CONF

T1  - Effect of bismuth flux on the optical and morphological properties of GaAsBi grown by Molecular Beam Epitaxy

JO  - 2022 IEEE 8th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA)

UR  - http://dx.doi.org/10.1109/icsima55652.2022.9929153

PY  - 2022/09/26

AU  - Harun F

AU  - Richards RD

AU  - David JP

ED  - 

DO  - DOI: 10.1109/icsima55652.2022.9929153

PB  - IEEE

Y2  - 2024/12/20

ER  -