TY  - JOUR

T1  - Diffusion processes in strained silicon germanium island structures

JO  - Diffusion and Defect Data. Pt A Defect and Diffusion Forum

PY  - 2000/01/01

AU  - Walther T

ED  - 

DO  - DOI: 10.4028/www.scientific.net/ddf.183-185.53

VL  - 183

SP  - 53

EP  - 60

Y2  - 2024/10/23

ER  -