TY  - CONF

T1  - Reliability Study and Modelling of IGBT Press-Pack Power Modules

JO  - 2017 THIRTY SECOND ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC)

UR  - http://eprints.whiterose.ac.uk/119759/

PY  - 2017/05/17

AU  - Long HY

AU  - Sweet MR

AU  - Narayanan EMS

AU  - Li G

AU  - IEEE

ED  - 

SP  - 2711

EP  - 2717

Y2  - 2024/10/23

ER  -