TY  - JOUR

T1  - Excess noise measurement in In0.53Ga0.47As

JO  - IEEE PHOTONIC TECH L

UR  - http://eprints.whiterose.ac.uk/892/

PY  - 2005/11/01

AU  - Goh YL

AU  - Ng JS

AU  - Tan CH

AU  - Ng WK

AU  - David JPR

ED  - 

DO  - DOI: 10.1109/LPT.2005.857239

VL  - 17

IS  - 11

SP  - 2412

EP  - 2414

Y2  - 2024/12/20

ER  -