TY  - JOUR

T1  - Measurement of diffusion lengths in quaternary semiconducting thin layers by spectrum imaging

JO  - Physica B: Condensed Matter

PY  - 2001/01/01

AU  - Walther T

ED  - 

DO  - DOI: 10.1016/S0921-4526(01)00933-4

VL  - 308-310

SP  - 1161

EP  - 1164

Y2  - 2024/10/23

ER  -