TY  - CONF

T1  - Surface Nano-Structuring of Semiconductors by Nanosecond Pulsed Laser Interference

JO  - 2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

UR  - http://dx.doi.org/10.1109/3m-nano58613.2023.10305322

PY  - 2023/07/31

AU  - Wang Y-R

AU  - Han IS

AU  - Hopkinson M

ED  - 

DO  - DOI: 10.1109/3m-nano58613.2023.10305322

PB  - IEEE

Y2  - 2024/12/22

ER  -