TY  - JOUR

T1  - Crosstalk in monolithic GaN-on-Silicon power electronic devices

JO  - Microelectronics Reliability

PY  - 2014/09/01

AU  - Unni V

AU  - Kawai H

AU  - Narayanan EMS

ED  - 

DO  - DOI: 10.1016/j.microrel.2014.07.104

PB  - Elsevier BV

VL  - 54

IS  - 9-10

SP  - 2242

EP  - 2247

Y2  - 2024/12/20

ER  -