@inproceedings{inproceedings, title  = {{Nature of hot carrier damage in Spacer oxide of LDD n-MOSFETs}},

 url = {{}},

 year = {{2002}},

 month = {{1}},

 author = {{Manhas SK and Sekhar DC and Oates AS and De Souza MM and IEEE and IEEE}},

 journal = {{2002 23RD INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS}},

 pages = {{735-739}},

 note = {{Accessed on 2025/03/11}}}