TY  - CONF

T1  - Determining sample thickness in transmission electron microscopy using X-ray line intensity ratios

CY  - Oxford

PY  - 2012/09/01

AU  - Parri MC

AU  - Walther T

ED  - Stokes DJ

ED  - Hutchison JL

PB  - Royal Microscopical Society

SN  - 978-0-9502463-6-9

VL  - 2

IS  - Physical Sciences: Tools and Techniques

SP  - 645

EP  - 646

Y2  - 2024/10/23

ER  -