TY  - JOUR

T1  - D <inf>it</inf> extraction from conductance-frequency measurements using a transmission-line model in weak inversion of poly/TiN/HfO <inf>2</inf> nMOSFETs

JO  - IEEE Transactions on Electron Devices

PY  - 2012/03/01

AU  - Sicre SBF

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1109/TED.2011.2179657

VL  - 59

IS  - 3

SP  - 827

EP  - 834

Y2  - 2025/03/11

ER  -