TY  - CONF

T1  - Prediction of the Impact of Thermal Cycling on Machine Lifetime Based on Accelerated Life Testing and Finite Element Analysis

JO  - IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society

PY  - 2021/10/13

AU  - Hewitt D

AU  - Wang J

ED  - 

DO  - DOI: 10.1109/iecon48115.2021.9589387

PB  - IEEE

Y2  - 2024/12/22

ER  -