TY  - JOUR

T1  - Computer Simulation of Defect Properties and Processes at High Temperature

JO  - MRS Proceedings

PY  - 2011/02/28

AU  - Harding JH

ED  - 

DO  - DOI: 10.1557/proc-60-163

PB  - Springer Science and Business Media LLC

VL  - 60

Y2  - 2024/12/22

ER  -