@article{article, title  = {{A comparison of early stage hot carrier degradation behaviour in 5 and 3 V sub-micron low doped drain metal oxide semiconductor field effect transistors.}},

 url = {{}},

 year = {{2001}},

 month = {{1}},

 author = {{Souza MMD and Wang J and Manhas SK and Narayanan EMS and Oates AS}},

 volume = {{41}},

 journal = {{Microelectron. Reliab.}},

 pages = {{169-177}},

 note = {{Accessed on 2024/10/23}}}