TY  - CONF

T1  - Structural and spectroscopic characterisation of amorphous silicon sub-oxides

CY  - Brno

PY  - 2000/01/01

AU  - Schulmeister K

AU  - Walther T

AU  - Mader W

ED  - Gemperlova J

ED  - Vavra I

PB  - Czechoslovak Sociery for Electron Microscopy

VL  - 2 (Physical Sciences)

SP  - 465

EP  - 466

Y2  - 2024/12/20

ER  -