TY  - JOUR

T1  - Numerical Analysis of 3-D Scaling Rules on a 1.2-kV Trench Clustered IGBT

JO  - IEEE Transactions on Electron Devices

UR  - http://eprints.whiterose.ac.uk/127537/

PY  - 2018/04/01

AU  - Luo P

AU  - Long HY

AU  - Sweet MR

AU  - De Souza M

AU  - Madathil SNE

ED  - 

DO  - DOI: 10.1109/TED.2018.2807318

PB  - Institute of Electrical and Electronics Engineers

VL  - 65

IS  - 4

SP  - 1440

EP  - 1446

Y2  - 2024/12/20

ER  -